Direct observation of electromagnetic near field in silicon nanophotonics devices using scanning thermal microscopy (SThM) technique

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We observe directly for the first time optical near field in silicon nanophotonics devices with nanoscale resolution using near field scanning thermal microscopy and demonstrated its advantage over the NSOM technique.

Original languageEnglish
Title of host publication2014 Conference on Lasers and Electro-Optics, CLEO 2014
StatePublished - 2014
Event2014 Conference on Lasers and Electro-Optics, CLEO 2014 - San Jose, United States
Duration: 8 Jun 201413 Jun 2014

Conference

Conference2014 Conference on Lasers and Electro-Optics, CLEO 2014
Country/TerritoryUnited States
CitySan Jose
Period8/06/1413/06/14

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Atomic and Molecular Physics, and Optics
  • Electronic, Optical and Magnetic Materials

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