Direct observation of electromagnetic near field in silicon nanophotonics devices using scanning thermal microscopy (SThM) technique

Meir Grajower; Liron Stern; Boris Desiatov; Ilya Goykhman; Uriel Levy

Direct observation of electromagnetic near field in silicon nanophotonics devices using scanning thermal microscopy (SThM) technique

Meir Grajower, Liron Stern, Boris Desiatov, Ilya Goykhman, Uriel Levy

Research output: Contribution to conference › Paper › peer-review

Abstract

We observe directly for the first time optical near field in silicon nanophotonics devices with nanoscale resolution using near field scanning thermal microscopy and demonstrated its advantage over the NSOM technique.

Original language	English
State	Published - 2014
Event	2014 Conference on Lasers and Electro-Optics, CLEO 2014 - San Jose, United States Duration: 8 Jun 2014 → 13 Jun 2014

Conference

Conference	2014 Conference on Lasers and Electro-Optics, CLEO 2014
Country/Territory	United States
City	San Jose
Period	8/06/14 → 13/06/14

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering
Atomic and Molecular Physics, and Optics
Electronic, Optical and Magnetic Materials

Cite this

@conference{747aecbc82af42f0be3671534e697e47,

title = "Direct observation of electromagnetic near field in silicon nanophotonics devices using scanning thermal microscopy (SThM) technique",

abstract = "We observe directly for the first time optical near field in silicon nanophotonics devices with nanoscale resolution using near field scanning thermal microscopy and demonstrated its advantage over the NSOM technique.",

author = "Meir Grajower and Liron Stern and Boris Desiatov and Ilya Goykhman and Uriel Levy",

note = "Publisher Copyright: {\textcopyright} 2014 Optical Society of America.; 2014 Conference on Lasers and Electro-Optics, CLEO 2014 ; Conference date: 08-06-2014 Through 13-06-2014",

year = "2014",

language = "الإنجليزيّة",

}

TY - CONF

T1 - Direct observation of electromagnetic near field in silicon nanophotonics devices using scanning thermal microscopy (SThM) technique

AU - Grajower, Meir

AU - Stern, Liron

AU - Desiatov, Boris

AU - Goykhman, Ilya

AU - Levy, Uriel

PY - 2014

Y1 - 2014

N2 - We observe directly for the first time optical near field in silicon nanophotonics devices with nanoscale resolution using near field scanning thermal microscopy and demonstrated its advantage over the NSOM technique.

AB - We observe directly for the first time optical near field in silicon nanophotonics devices with nanoscale resolution using near field scanning thermal microscopy and demonstrated its advantage over the NSOM technique.

UR - http://www.scopus.com/inward/record.url?scp=84944707675&partnerID=8YFLogxK

M3 - محاضرة

T2 - 2014 Conference on Lasers and Electro-Optics, CLEO 2014

Y2 - 8 June 2014 through 13 June 2014

ER -

Direct observation of electromagnetic near field in silicon nanophotonics devices using scanning thermal microscopy (SThM) technique

Abstract

Conference

All Science Journal Classification (ASJC) codes

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