DiL: An Explainable and Practical Metric for Abnormal Uncertainty in Object Detection

Amit Giloni, Omer Hofman, Ikuya Morikawa, Toshiya Shimizu, Yuval Elovici, Asaf Shabtai

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Although object detection models are widely used, their predictive performance has been shown to deteriorate when faced with abnormal scenes. Such abnormalities can occur naturally (by partially occluded or out-of-distribution objects) or deliberately (in the case of an adversarial attack). Existing uncertainty quantification methods, such as object detection evaluation metrics and label-uncertainty quantification techniques, do not consider the abnormalities' effect on the model's internal decision-making process. Furthermore, practical methods that consider the effects of abnormalities (such as abnormality detection and mitigation) are designed to deal with one type of abnormality. We present distinctive localization (DiL), an unsupervised, practical and explainable metric that quantitatively interprets any type of abnormality and can be leveraged for preventive purposes. By utilizing XAI techniques (saliency maps), DiL maps the objectness of a given scene and captures the model's inner uncertainty regarding the identified (and missed) objects. DiL was evaluated across nine use cases, including partially occluded and out-of-distribution objects, as well as adversarial patches, in both physical and digital spaces, on benchmark datasets, and our newly E-PO dataset (generated with DALL-E 2). Our results show that DiL: i) successfully interprets and quantifies an abnormality's effect on the model's decision-making process, regardless of the abnormality type; and ii) can be leveraged to detect and mitigate this effect.

Original languageAmerican English
Title of host publicationProceedings - 2025 IEEE Winter Conference on Applications of Computer Vision, WACV 2025
Pages2507-2516
Number of pages10
ISBN (Electronic)9798331510831
DOIs
StatePublished - 1 Jan 2025
Event2025 IEEE/CVF Winter Conference on Applications of Computer Vision, WACV 2025 - Tucson, United States
Duration: 28 Feb 20254 Mar 2025

Publication series

NameProceedings - 2025 IEEE Winter Conference on Applications of Computer Vision, WACV 2025

Conference

Conference2025 IEEE/CVF Winter Conference on Applications of Computer Vision, WACV 2025
Country/TerritoryUnited States
CityTucson
Period28/02/254/03/25

Keywords

  • abnormality detection
  • abnormality mitigation
  • adversarial ml
  • object detection
  • out-of-distribution
  • partial occlusion
  • uncertainty metric

All Science Journal Classification (ASJC) codes

  • Artificial Intelligence
  • Computer Science Applications
  • Computer Vision and Pattern Recognition
  • Human-Computer Interaction
  • Modelling and Simulation
  • Radiology Nuclear Medicine and imaging

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