Bar-Ilan University
Research output: Patent
}
TY - PAT
T1 - Detecting Unreliable bits in transistor circuitry
AU - Shor, J.
AU - Weizman, Y.
AU - Shifman, Y.
PY - 2019
Y1 - 2019
UR - https://patentimages.storage.googleapis.com/b2/f6/75/913790f42a7f08/US20190074984A1.pdf
M3 - Patent
M1 - US10999083B2
ER -