Design for a 10 keV multi-pass transmission electron microscope

Stewart A. Koppell; Marian Mankos; Adam J. Bowman; Yonatan Israel; Thomas Juffmann; Brannon B. Klopfer; Mark A. Kasevich

doi:10.1016/j.ultramic.2019.112834

Design for a 10 keV multi-pass transmission electron microscope

Stewart A. Koppell, Marian Mankos, Adam J. Bowman, Yonatan Israel, Thomas Juffmann, Brannon B. Klopfer, Mark A. Kasevich

Research output: Contribution to journal › Article › peer-review

Abstract

Multi-pass transmission electron microscopy (MPTEM) has been proposed as a way to reduce damage to radiation-sensitive materials. For the field of cryo-electron microscopy (cryo-EM), this would significantly reduce the number of projections needed to create a 3D model and would allow the imaging of lower-contrast, more heterogeneous samples. We have designed a 10 keV proof-of-concept MPTEM. The column features fast-switching gated electron mirrors which cause each electron to interrogate the sample multiple times. A linear approximation for the multi-pass contrast transfer function (CTF) is developed to explain how the resolution depends on the number of passes through the sample.

Original language	English
Article number	112834
Journal	Ultramicroscopy
Volume	207
DOIs	https://doi.org/10.1016/j.ultramic.2019.112834
State	Published - Dec 2019
Externally published	Yes

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Instrumentation

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10.1016/j.ultramic.2019.112834

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title = "Design for a 10 keV multi-pass transmission electron microscope",

abstract = "Multi-pass transmission electron microscopy (MPTEM) has been proposed as a way to reduce damage to radiation-sensitive materials. For the field of cryo-electron microscopy (cryo-EM), this would significantly reduce the number of projections needed to create a 3D model and would allow the imaging of lower-contrast, more heterogeneous samples. We have designed a 10 keV proof-of-concept MPTEM. The column features fast-switching gated electron mirrors which cause each electron to interrogate the sample multiple times. A linear approximation for the multi-pass contrast transfer function (CTF) is developed to explain how the resolution depends on the number of passes through the sample.",

author = "Koppell, {Stewart A.} and Marian Mankos and Bowman, {Adam J.} and Yonatan Israel and Thomas Juffmann and Klopfer, {Brannon B.} and Kasevich, {Mark A.}",

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year = "2019",

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doi = "10.1016/j.ultramic.2019.112834",

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AU - Koppell, Stewart A.

AU - Mankos, Marian

AU - Bowman, Adam J.

AU - Israel, Yonatan

AU - Juffmann, Thomas

AU - Klopfer, Brannon B.

AU - Kasevich, Mark A.

PY - 2019/12

Y1 - 2019/12

N2 - Multi-pass transmission electron microscopy (MPTEM) has been proposed as a way to reduce damage to radiation-sensitive materials. For the field of cryo-electron microscopy (cryo-EM), this would significantly reduce the number of projections needed to create a 3D model and would allow the imaging of lower-contrast, more heterogeneous samples. We have designed a 10 keV proof-of-concept MPTEM. The column features fast-switching gated electron mirrors which cause each electron to interrogate the sample multiple times. A linear approximation for the multi-pass contrast transfer function (CTF) is developed to explain how the resolution depends on the number of passes through the sample.

AB - Multi-pass transmission electron microscopy (MPTEM) has been proposed as a way to reduce damage to radiation-sensitive materials. For the field of cryo-electron microscopy (cryo-EM), this would significantly reduce the number of projections needed to create a 3D model and would allow the imaging of lower-contrast, more heterogeneous samples. We have designed a 10 keV proof-of-concept MPTEM. The column features fast-switching gated electron mirrors which cause each electron to interrogate the sample multiple times. A linear approximation for the multi-pass contrast transfer function (CTF) is developed to explain how the resolution depends on the number of passes through the sample.

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DO - 10.1016/j.ultramic.2019.112834

M3 - مقالة

C2 - 31520925

SN - 0304-3991

VL - 207

JO - Ultramicroscopy

JF - Ultramicroscopy

M1 - 112834

ER -

Design for a 10 keV multi-pass transmission electron microscope

Abstract

All Science Journal Classification (ASJC) codes

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