Design and fundamental limits of nearfield magnetic-force scanning microscopy via the no-cloning theorem

Jonathan Nemirovsky; Chen Mechel; Eliahu Cohen; Ido Kaminer

doi:10.1364/CLEO_AT.2020.AF3K.6

Design and fundamental limits of nearfield magnetic-force scanning microscopy via the no-cloning theorem

Jonathan Nemirovsky, Chen Mechel, Eliahu Cohen, Ido Kaminer

Technion - Israel Institute of Technology, Bar-Ilan University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

We analyze nearfield measurements of magnetic fields originating from quantum sources and measured by quantum probes. We show that cloning-inspired techniques reveal optimal measurement schemes and new universal precision bounds for nearfield detectors.

Original language	English
Title of host publication	CLEO
Subtitle of host publication	Applications and Technology, CLEO_AT 2020
DOIs	https://doi.org/10.1364/CLEO_AT.2020.AF3K.6
State	Published - 2020
Event	CLEO: Applications and Technology, CLEO_AT 2020 - Washington, United States Duration: 10 May 2020 → 15 May 2020

Publication series

Name	Optics InfoBase Conference Papers
Volume	Part F181-CLEO-AT 2020

Conference

Conference	CLEO: Applications and Technology, CLEO_AT 2020
Country/Territory	United States
City	Washington
Period	10/05/20 → 15/05/20

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Mechanics of Materials

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10.1364/CLEO_AT.2020.AF3K.6

Cite this

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title = "Design and fundamental limits of nearfield magnetic-force scanning microscopy via the no-cloning theorem",

abstract = "We analyze nearfield measurements of magnetic fields originating from quantum sources and measured by quantum probes. We show that cloning-inspired techniques reveal optimal measurement schemes and new universal precision bounds for nearfield detectors.",

author = "Jonathan Nemirovsky and Chen Mechel and Eliahu Cohen and Ido Kaminer",

note = "Publisher Copyright: CLEO 2020 {\textcopyright} OSA 2020 {\textcopyright} 2020 The Author(s).; CLEO: Applications and Technology, CLEO_AT 2020 ; Conference date: 10-05-2020 Through 15-05-2020",

year = "2020",

doi = "10.1364/CLEO_AT.2020.AF3K.6",

language = "الإنجليزيّة",

isbn = "9781943580767",

series = "Optics InfoBase Conference Papers",

booktitle = "CLEO",

}

Nemirovsky, J, Mechel, C, Cohen, E & Kaminer, I 2020, Design and fundamental limits of nearfield magnetic-force scanning microscopy via the no-cloning theorem. in CLEO: Applications and Technology, CLEO_AT 2020., AF3K.6, Optics InfoBase Conference Papers, vol. Part F181-CLEO-AT 2020, CLEO: Applications and Technology, CLEO_AT 2020, Washington, United States, 10/05/20. https://doi.org/10.1364/CLEO_AT.2020.AF3K.6

Design and fundamental limits of nearfield magnetic-force scanning microscopy via the no-cloning theorem. / Nemirovsky, Jonathan; Mechel, Chen; Cohen, Eliahu et al.
CLEO: Applications and Technology, CLEO_AT 2020. 2020. AF3K.6 (Optics InfoBase Conference Papers; Vol. Part F181-CLEO-AT 2020).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Design and fundamental limits of nearfield magnetic-force scanning microscopy via the no-cloning theorem

AU - Nemirovsky, Jonathan

AU - Mechel, Chen

AU - Cohen, Eliahu

AU - Kaminer, Ido

PY - 2020

Y1 - 2020

N2 - We analyze nearfield measurements of magnetic fields originating from quantum sources and measured by quantum probes. We show that cloning-inspired techniques reveal optimal measurement schemes and new universal precision bounds for nearfield detectors.

AB - We analyze nearfield measurements of magnetic fields originating from quantum sources and measured by quantum probes. We show that cloning-inspired techniques reveal optimal measurement schemes and new universal precision bounds for nearfield detectors.

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U2 - 10.1364/CLEO_AT.2020.AF3K.6

DO - 10.1364/CLEO_AT.2020.AF3K.6

M3 - منشور من مؤتمر

SN - 9781943580767

T3 - Optics InfoBase Conference Papers

BT - CLEO

T2 - CLEO: Applications and Technology, CLEO_AT 2020

Y2 - 10 May 2020 through 15 May 2020

ER -

Design and fundamental limits of nearfield magnetic-force scanning microscopy via the no-cloning theorem

Abstract

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Conference

All Science Journal Classification (ASJC) codes

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