Demonstration of a bit-flip correction for enhanced sensitivity measurements

L. Cohen; Y. Pilnyak; D. Istrati; A. Retzker; H. S. Eisenberg

doi:10.1364/FIO.2016.FF1D.5

Demonstration of a bit-flip correction for enhanced sensitivity measurements

L. Cohen, Y. Pilnyak, D. Istrati, A. Retzker, H. S. Eisenberg

Racah Institute of Physics

The Hebrew University of Jerusalem

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Error correction can be used to recover the sensitivity in a noisy environment. We implement such correction after a bit-flip error. Our results show 87% recovery of the sensitivity, independent of the noise rate.

Original language	English
Title of host publication	Frontiers in Optics, FiO 2016
DOIs	https://doi.org/10.1364/FIO.2016.FF1D.5
State	Published - 2016
Event	Frontiers in Optics, FiO 2016 - Rochester, United States Duration: 17 Oct 2016 → 21 Oct 2016

Publication series

Name	Optics InfoBase Conference Papers

Conference

Conference	Frontiers in Optics, FiO 2016
Country/Territory	United States
City	Rochester
Period	17/10/16 → 21/10/16

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Mechanics of Materials

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10.1364/FIO.2016.FF1D.5

Cite this

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title = "Demonstration of a bit-flip correction for enhanced sensitivity measurements",

abstract = "Error correction can be used to recover the sensitivity in a noisy environment. We implement such correction after a bit-flip error. Our results show 87% recovery of the sensitivity, independent of the noise rate.",

author = "L. Cohen and Y. Pilnyak and D. Istrati and A. Retzker and Eisenberg, {H. S.}",

note = "Publisher Copyright: {\textcopyright} OSA 2016.; Frontiers in Optics, FiO 2016 ; Conference date: 17-10-2016 Through 21-10-2016",

year = "2016",

doi = "10.1364/FIO.2016.FF1D.5",

language = "الإنجليزيّة",

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series = "Optics InfoBase Conference Papers",

booktitle = "Frontiers in Optics, FiO 2016",

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AU - Cohen, L.

AU - Pilnyak, Y.

AU - Istrati, D.

AU - Retzker, A.

AU - Eisenberg, H. S.

PY - 2016

Y1 - 2016

N2 - Error correction can be used to recover the sensitivity in a noisy environment. We implement such correction after a bit-flip error. Our results show 87% recovery of the sensitivity, independent of the noise rate.

AB - Error correction can be used to recover the sensitivity in a noisy environment. We implement such correction after a bit-flip error. Our results show 87% recovery of the sensitivity, independent of the noise rate.

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U2 - 10.1364/FIO.2016.FF1D.5

DO - 10.1364/FIO.2016.FF1D.5

M3 - منشور من مؤتمر

SN - 9781943580194

T3 - Optics InfoBase Conference Papers

BT - Frontiers in Optics, FiO 2016

T2 - Frontiers in Optics, FiO 2016

Y2 - 17 October 2016 through 21 October 2016

ER -

Demonstration of a bit-flip correction for enhanced sensitivity measurements

Abstract

Publication series

Conference

All Science Journal Classification (ASJC) codes

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