Demonstration of a bit-flip correction for enhanced sensitivity measurements

L. Cohen, Y. Pilnyak, D. Istrati, A. Retzker, H. S. Eisenberg

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Error correction can be used to recover the sensitivity in a noisy environment. We implement such correction after a bit-flip error. Our results show 87% recovery of the sensitivity, independent of the noise rate.

Original languageEnglish
Title of host publicationQuantum Information and Measurement, QIM 2017
DOIs
StatePublished - 2017
EventQuantum Information and Measurement, QIM 2017 - Paris, France
Duration: 5 Apr 20177 Apr 2017

Publication series

NameOptics InfoBase Conference Papers
VolumePart F73-QIM 2017

Conference

ConferenceQuantum Information and Measurement, QIM 2017
Country/TerritoryFrance
CityParis
Period5/04/177/04/17

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials

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