Deep learning structured illumination microscopy

Doron Shterman, Gilad Feinberg, Shai Tsesses, Yochai Blau, Guy Bartal

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We propose a Deep Learning (DL) framework for reconstructing super-resolved images in structured illumination microscopy, which reduces the amount of raw data required for the reconstruction and allows real-time super resolution imaging.

Original languageEnglish
Title of host publicationCLEO
Subtitle of host publicationApplications and Technology, CLEO_AT 2020
DOIs
StatePublished - 2020
EventCLEO: Applications and Technology, CLEO_AT 2020 - Washington, United States
Duration: 10 May 202015 May 2020

Publication series

NameOptics InfoBase Conference Papers
VolumePart F181-CLEO-AT 2020

Conference

ConferenceCLEO: Applications and Technology, CLEO_AT 2020
Country/TerritoryUnited States
CityWashington
Period10/05/2015/05/20

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials

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