Data augmentation for leaf segmentation and counting tasks in rosette plants

Dmitry Kuznichov, Alon Zvirin, Yaron Honen, Ron Kimmel

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Deep learning techniques involving image processing and data analysis are constantly evolving. Many domains adapt these techniques for object segmentation, instantiation and classification. Recently, agricultural industries adopted those techniques in order to bring automation to farmers around the globe. One analysis procedure required for automatic visual inspection in this domain is leaf count and segmentation. Collecting labeled data from field crops and greenhouses is a complicated task due to the large variety of crops, growth seasons, climate changes, phenotype diversity, and more, especially, when specific learning tasks require a large amount of labeled data for training. Data augmentation for training deep neural networks is well established, examples include data synthesis, using generative semi-synthetic models, and applying various kinds of transformations. In this paper we propose a data augmentation method that preserves the geometric structure of the data objects, thus keeping the physical appearance of the data-set as close as possible to imaged plants in real agricultural scenes. The proposed method provides state of the art results when applied to the standard benchmark in the field, namely, the ongoing Leaf Segmentation Challenge hosted by Computer Vision Problems in Plant Phenotyping.

Original languageEnglish
Title of host publicationProceedings - 2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2019
Pages2580-2589
Number of pages10
ISBN (Electronic)9781728125060
DOIs
StatePublished - Jun 2019
Event32nd IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2019 - Long Beach, United States
Duration: 16 Jun 201920 Jun 2019

Publication series

NameIEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
Volume2019-June

Conference

Conference32nd IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2019
Country/TerritoryUnited States
CityLong Beach
Period16/06/1920/06/19

All Science Journal Classification (ASJC) codes

  • Computer Vision and Pattern Recognition
  • Electrical and Electronic Engineering

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