Cryogenic electron spin resonance microimaging probe

Ygal Twig; Ekaterina Dikarov; Aharon Blank

doi:https://doi.org/10.1016/j.jmr.2012.03.005

Cryogenic electron spin resonance microimaging probe

Ygal Twig, Ekaterina Dikarov, Aharon Blank

Technion - Israel Institute of Technology

Research output: Contribution to journal › Article › peer-review

Abstract

A new probe for acquiring ESR images with microscopic resolution and high spin sensitivity, at a temperature range of ∼4.2-300 K, is presented. Details of the probe design, as well as its principle of operation, are provided. The probe incorporates a unique surface loop-gap microresonator. Experimental results demonstrate the system's capability to acquire two - as well as three-dimensional images with a flat test sample of phosphorus-doped silicon. The imaging results also allow verifying the resonator's resonance mode - they show its B₁ distribution, which also makes it possible to estimate the number of spins measured in the sample.

Original language	English
Pages (from-to)	22-29
Number of pages	8
Journal	JOURNAL OF MAGNETIC RESONANCE
Volume	218
DOIs	https://doi.org/10.1016/j.jmr.2012.03.005
State	Published - May 2012

Keywords

Cryogenic temperatures
EPR
ESR
Microimaging
Spin sensitivity

All Science Journal Classification (ASJC) codes

Biophysics
Biochemistry
Nuclear and High Energy Physics
Condensed Matter Physics

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https://doi.org/10.1016/j.jmr.2012.03.005

Cite this

@article{ec54771334884a548c5532fedd62412f,

title = "Cryogenic electron spin resonance microimaging probe",

abstract = "A new probe for acquiring ESR images with microscopic resolution and high spin sensitivity, at a temperature range of ∼4.2-300 K, is presented. Details of the probe design, as well as its principle of operation, are provided. The probe incorporates a unique surface loop-gap microresonator. Experimental results demonstrate the system's capability to acquire two - as well as three-dimensional images with a flat test sample of phosphorus-doped silicon. The imaging results also allow verifying the resonator's resonance mode - they show its B1 distribution, which also makes it possible to estimate the number of spins measured in the sample.",

keywords = "Cryogenic temperatures, EPR, ESR, Microimaging, Spin sensitivity",

author = "Ygal Twig and Ekaterina Dikarov and Aharon Blank",

note = "Funding Information: This work was partially supported by Grant # 213/09 from the ISF, Grant # 2009401 from the BSF, Grant # 201665 from the ERC, Grant # G-1032-18.14/2009 from the GIF, and by the RBNI center at the Technion. We greatly acknowledge Dr. Wayne D. Hutchison (The University of New South Wales, Australia) for supplying us with the 28 Si:P sample.",

year = "2012",

month = may,

doi = "https://doi.org/10.1016/j.jmr.2012.03.005",

language = "الإنجليزيّة",

volume = "218",

pages = "22--29",

journal = "JOURNAL OF MAGNETIC RESONANCE",

issn = "1090-7807",

publisher = "Academic Press Inc.",

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TY - JOUR

T1 - Cryogenic electron spin resonance microimaging probe

AU - Twig, Ygal

AU - Dikarov, Ekaterina

AU - Blank, Aharon

N1 - Funding Information: This work was partially supported by Grant # 213/09 from the ISF, Grant # 2009401 from the BSF, Grant # 201665 from the ERC, Grant # G-1032-18.14/2009 from the GIF, and by the RBNI center at the Technion. We greatly acknowledge Dr. Wayne D. Hutchison (The University of New South Wales, Australia) for supplying us with the 28 Si:P sample.

PY - 2012/5

Y1 - 2012/5

N2 - A new probe for acquiring ESR images with microscopic resolution and high spin sensitivity, at a temperature range of ∼4.2-300 K, is presented. Details of the probe design, as well as its principle of operation, are provided. The probe incorporates a unique surface loop-gap microresonator. Experimental results demonstrate the system's capability to acquire two - as well as three-dimensional images with a flat test sample of phosphorus-doped silicon. The imaging results also allow verifying the resonator's resonance mode - they show its B1 distribution, which also makes it possible to estimate the number of spins measured in the sample.

AB - A new probe for acquiring ESR images with microscopic resolution and high spin sensitivity, at a temperature range of ∼4.2-300 K, is presented. Details of the probe design, as well as its principle of operation, are provided. The probe incorporates a unique surface loop-gap microresonator. Experimental results demonstrate the system's capability to acquire two - as well as three-dimensional images with a flat test sample of phosphorus-doped silicon. The imaging results also allow verifying the resonator's resonance mode - they show its B1 distribution, which also makes it possible to estimate the number of spins measured in the sample.

KW - Cryogenic temperatures

KW - EPR

KW - ESR

KW - Microimaging

KW - Spin sensitivity

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U2 - https://doi.org/10.1016/j.jmr.2012.03.005

DO - https://doi.org/10.1016/j.jmr.2012.03.005

M3 - مقالة

SN - 1090-7807

VL - 218

SP - 22

EP - 29

JO - JOURNAL OF MAGNETIC RESONANCE

JF - JOURNAL OF MAGNETIC RESONANCE

ER -

Cryogenic electron spin resonance microimaging probe

Abstract

Keywords

All Science Journal Classification (ASJC) codes

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