Corrigendum to “Spherical aberration correction in a scanning transmission electron microscope using a sculpted thin film” [Ultramicroscopy 189 (2018) 46–53] (Ultramicroscopy (2018) 189 (46–53), (S0304399117305259), (10.1016/j.ultramic.2018.03.016))

Roy Shiloh, Roei Remez, Peng Han Lu, Lei Jin, Yossi Lereah, Amir H. Tavabi, Rafal E. Dunin-Borkowski, Ady Arie

Research output: Contribution to journalComment/debate

Abstract

The authors regret for the typo in Eq. (1), where Cs was exchanged with the adjacent parenthesis. The correct form of the equation is naturally, [Formula presented] On page 2, the combined spherical aberration coefficient Cs, eff(α) is calculated. To compensate the microscope's inherent positive spherical aberration Cs, the sign of the aberration imparted by the thin film corrector, [Formula presented], should be negative. This can either be explicitly stated by setting [Formula presented] throughout the paper, or implicitly by rewriting the combined spherical aberration coefficient with a negative sign, [Formula presented]. In either case, the thin film corrector profile, Eq. (3), should concur with the shape presented in Fig. 3. The correction of these typos has no impact whatsoever on the measurements, analysis, or results presented in the paper. The authors would like to apologise for any inconvenience caused.

Original languageEnglish
Article number112965
JournalUltramicroscopy
Volume216
DOIs
StatePublished - Sep 2020

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

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