Comparison of random field strengths in (1-x)SrTiO3-x BiFeO3and (1-x)SrTiO3-x BaTiO3relaxor ferroelectrics by means of acoustic emission

Evgeniy Dul'Kin, Michael Roth

Research output: Contribution to journalArticlepeer-review

Abstract

In relaxor (1-x)SrTiO3-xBiFeO3 ferroelectrics ceramics (x=0.2, 0.3 and 0.4) both intermediate temperatures and Burns temperatures were successfully detected and their behavior were investigated in dependence on an external bias field using an acoustic emission. All these temperatures exhibit a non-trivial behavior, i.e. attain the minima at some threshold fields as a bias field enhances. It is established that the threshold fields decrease as x increases in (1-x)SrTiO3-xBiFeO3, as it previously observed in (1-x)SrTiO3-xBaTiO3 (E. Dul'kin, J. Zhai, M. Roth, Phys. Status Solidi B 252, 2079 (2015)). Based on the data of the threshold fields the mechanisms of arising of random electric fields are discussed and their strengths are compared in both these relaxor ferroelectrics.

Original languageAmerican English
Article numberap200075
JournalEPJ Applied Physics
Volume92
Issue number2
DOIs
StatePublished - 1 Nov 2020

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Instrumentation
  • Condensed Matter Physics

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