TY - GEN
T1 - CNN Based Yeast Cell Segmentation in Multi-modal Fluorescent Microscopy Data
AU - Aydin, Ali Selman
AU - Dubey, Abhinandan
AU - Dovrat, Daniel
AU - Aharoni, Amir
AU - Shilkrot, Roy
N1 - Publisher Copyright: © 2017 IEEE.
PY - 2017/8/22
Y1 - 2017/8/22
N2 - We present a method for foreground segmentation of yeast cells in the presence of high-noise induced by intentional low illumination, where traditional approaches (e.g., threshold-based methods, specialized cell-segmentation methods) fail. To deal with these harsh conditions, we use a fully-convolutional semantic segmentation network based on the SegNet architecture. Our model is capable of segmenting patches extracted from yeast live-cell experiments with a mIOU score of 0.71 on unseen patches drawn from independent experiments. Further, we show that simultaneous multi-modal observations of bio-fluorescent markers can result in better segmentation performance than the DIC channel alone.
AB - We present a method for foreground segmentation of yeast cells in the presence of high-noise induced by intentional low illumination, where traditional approaches (e.g., threshold-based methods, specialized cell-segmentation methods) fail. To deal with these harsh conditions, we use a fully-convolutional semantic segmentation network based on the SegNet architecture. Our model is capable of segmenting patches extracted from yeast live-cell experiments with a mIOU score of 0.71 on unseen patches drawn from independent experiments. Further, we show that simultaneous multi-modal observations of bio-fluorescent markers can result in better segmentation performance than the DIC channel alone.
UR - http://www.scopus.com/inward/record.url?scp=85030264167&partnerID=8YFLogxK
U2 - 10.1109/CVPRW.2017.105
DO - 10.1109/CVPRW.2017.105
M3 - Conference contribution
T3 - IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
SP - 753
EP - 759
BT - Proceedings - 30th IEEE Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2017
T2 - 30th IEEE Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2017
Y2 - 21 July 2017 through 26 July 2017
ER -