Abstract
Asymmetry and anisotropy are important parameters in rotating devices that can cause instability; indicate a manufacturing defect or a developing fault. The present paper discusses an identification method capable of detecting minute levels of asymmetry by exploiting the unique dynamics of parametric excitation caused by asymmetry and rotation. The detection relies on rigid body dynamics without resorting to nonlinear vibration analysis, and the natural dynamics of elastically supported systems is exploited in order to increase the sensitivity to asymmetry. It is possible to isolate asymmetry from other rotation-induced phenomena like unbalance. An asymmetry detection machine which was built in the laboratory demonstrates the method alongside theoretical analysis.
Original language | English |
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Pages (from-to) | 502-509 |
Number of pages | 8 |
Journal | Mechanical Systems and Signal Processing |
Volume | 41 |
Issue number | 1-2 |
DOIs | |
State | Published - Dec 2013 |
Keywords
- Asymmetry identification
- Parametric excitation
- Rotating structures
All Science Journal Classification (ASJC) codes
- Control and Systems Engineering
- Signal Processing
- Civil and Structural Engineering
- Aerospace Engineering
- Mechanical Engineering
- Computer Science Applications