Application of Hilbert Analysis in Orthogonal Fourier Fringe-Projection to Improve Object Shape Reconstruction

Ori Izhak Rosenberg, David Abookasis

Research output: Contribution to journalArticlepeer-review

Abstract

Abstract: Three-dimensional (3D) measurement of an object is widely used in many fields including machine vision, quality control, robotics, medical diagnostics, and others. High-precision 3D surface topography is necessary for describing object shape accurately with high spatial resolution. A combined approach to improve 3D object shape recovery based on Fourier orthogonal fringe projection together with Hilbert transform is proposed and demonstrated. This new idea of combination is highly effective due to the suppressing of background intensity of the deformed fringe pattern while the zero spectrum is extracted precisely and easily. Removing the zero order component leads to increase the visualization and resolution of the measured object. Application of Hilbert processing for object shape recovery in orthogonal Fourier projection domain to improve 3D visualization has not been reported before. The processing framework of this strategy is described in detail. Validation of the proposed method is verified by experiments including visualization of objects with various shapes and sizes. A comparison between profilometry methods is also given which verify better performance in reconstruction of complex objects. 3D reconstruction of flow running at different speeds on a scattering medium with this combined approach is also demonstrated for the first time.

Original languageAmerican English
Pages (from-to)679-691
Number of pages13
JournalOptics and Spectroscopy (English translation of Optika i Spektroskopiya)
Volume129
Issue number6
DOIs
StatePublished - 1 Jun 2021

Keywords

  • 3D shape measurements
  • Fourier and Hilbert transform
  • image processing
  • orthogonal fringes

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics

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