Analysis of White Light Speckle Imaging

Moran Davoodi; Yaakov Buchris; Israel Cohen

doi:10.1109/ICSEE.2018.8646158

Analysis of White Light Speckle Imaging

Moran Davoodi, Yaakov Buchris, Israel Cohen

Technion - Israel Institute of Technology

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

In this paper, we present a new approach for analyzing white light speckle patterns. The paper introduces an analytic model and heuristic explanations for the phenomena using the contrast and intensity statistics of the speckles. Relations between the coherence length, central wavelength and surface roughness are examined. It is shown that the speckle intensity is directly related to the autocorrelation function. We show that the new approach is consistent with previous models using simulation results and experimental data.

Original language	English
Title of host publication	2018 IEEE International Conference on the Science of Electrical Engineering in Israel, ICSEE 2018
ISBN (Electronic)	9781538663783
DOIs	https://doi.org/10.1109/ICSEE.2018.8646158
State	Published - 2 Jul 2018
Event	2018 IEEE International Conference on the Science of Electrical Engineering in Israel, ICSEE 2018 - Eilat, Israel Duration: 12 Dec 2018 → 14 Dec 2018

Publication series

Name	2018 IEEE International Conference on the Science of Electrical Engineering in Israel, ICSEE 2018

Conference

Conference	2018 IEEE International Conference on the Science of Electrical Engineering in Israel, ICSEE 2018
Country/Territory	Israel
City	Eilat
Period	12/12/18 → 14/12/18

Keywords

Speckle
incoherent light
surface roughness

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering

Access to Document

10.1109/ICSEE.2018.8646158

Cite this

@inproceedings{91b262224444476f8abc5bfe99f9f8f2,

title = "Analysis of White Light Speckle Imaging",

abstract = "In this paper, we present a new approach for analyzing white light speckle patterns. The paper introduces an analytic model and heuristic explanations for the phenomena using the contrast and intensity statistics of the speckles. Relations between the coherence length, central wavelength and surface roughness are examined. It is shown that the speckle intensity is directly related to the autocorrelation function. We show that the new approach is consistent with previous models using simulation results and experimental data.",

keywords = "Speckle, incoherent light, surface roughness",

author = "Moran Davoodi and Yaakov Buchris and Israel Cohen",

note = "Publisher Copyright: {\textcopyright} 2018 IEEE.; 2018 IEEE International Conference on the Science of Electrical Engineering in Israel, ICSEE 2018 ; Conference date: 12-12-2018 Through 14-12-2018",

year = "2018",

month = jul,

day = "2",

doi = "10.1109/ICSEE.2018.8646158",

language = "الإنجليزيّة",

series = "2018 IEEE International Conference on the Science of Electrical Engineering in Israel, ICSEE 2018",

booktitle = "2018 IEEE International Conference on the Science of Electrical Engineering in Israel, ICSEE 2018",

}

Davoodi, M, Buchris, Y & Cohen, I 2018, Analysis of White Light Speckle Imaging. in 2018 IEEE International Conference on the Science of Electrical Engineering in Israel, ICSEE 2018., 8646158, 2018 IEEE International Conference on the Science of Electrical Engineering in Israel, ICSEE 2018, 2018 IEEE International Conference on the Science of Electrical Engineering in Israel, ICSEE 2018, Eilat, Israel, 12/12/18. https://doi.org/10.1109/ICSEE.2018.8646158

Analysis of White Light Speckle Imaging. / Davoodi, Moran; Buchris, Yaakov; Cohen, Israel.
2018 IEEE International Conference on the Science of Electrical Engineering in Israel, ICSEE 2018. 2018. 8646158 (2018 IEEE International Conference on the Science of Electrical Engineering in Israel, ICSEE 2018).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Analysis of White Light Speckle Imaging

AU - Davoodi, Moran

AU - Buchris, Yaakov

AU - Cohen, Israel

PY - 2018/7/2

Y1 - 2018/7/2

N2 - In this paper, we present a new approach for analyzing white light speckle patterns. The paper introduces an analytic model and heuristic explanations for the phenomena using the contrast and intensity statistics of the speckles. Relations between the coherence length, central wavelength and surface roughness are examined. It is shown that the speckle intensity is directly related to the autocorrelation function. We show that the new approach is consistent with previous models using simulation results and experimental data.

AB - In this paper, we present a new approach for analyzing white light speckle patterns. The paper introduces an analytic model and heuristic explanations for the phenomena using the contrast and intensity statistics of the speckles. Relations between the coherence length, central wavelength and surface roughness are examined. It is shown that the speckle intensity is directly related to the autocorrelation function. We show that the new approach is consistent with previous models using simulation results and experimental data.

KW - Speckle

KW - incoherent light

KW - surface roughness

UR - http://www.scopus.com/inward/record.url?scp=85063162834&partnerID=8YFLogxK

U2 - 10.1109/ICSEE.2018.8646158

DO - 10.1109/ICSEE.2018.8646158

M3 - منشور من مؤتمر

T3 - 2018 IEEE International Conference on the Science of Electrical Engineering in Israel, ICSEE 2018

BT - 2018 IEEE International Conference on the Science of Electrical Engineering in Israel, ICSEE 2018

T2 - 2018 IEEE International Conference on the Science of Electrical Engineering in Israel, ICSEE 2018

Y2 - 12 December 2018 through 14 December 2018

ER -

Analysis of White Light Speckle Imaging

Abstract

Publication series

Conference

Keywords

All Science Journal Classification (ASJC) codes

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