Algorithm Verification of Single-Shot Relativistic Emittance Proposed Measuring Method

Leon Feigin, Amir Weinberg, Ariel Nause

Research output: Contribution to journalArticlepeer-review

Abstract

A 6 MeV hybrid photo-cathode gun is driving a THz-FEL in Ariel University, as well as other applications. An electron bunch with small transverse emittance is extracted from a copper photo-cathode using a 1 ps UV laser pulse, and then accelerated to a kinetic energy of 6.5 MeV. The Hybrid term is due to the unique standing wave-traveling wave sections in a single RF cavity. Since low emittance is crucial for FEL operation, the characterization of the electron beam requires measuring the transverse emittance, which will be compared with the predicted design and the 3D simulation obtained values, in order to verify their correctness. In this paper, we confirm the use of the multi-slit technique to measure emittance in the Hybrid beam in a single shot and develop a simple and convenient algorithm to be used in the experimental measurements. The experimental analysis requires image processing of the measured data, combined with a custom LabVIEW and Matlab scripts to control the hardware, and analyze the obtained data. Prior to experimentally measuring emittance, we perform a simulated experiment, using a simulated beam from the General Particle Tracer (GPT) code to test these algorithms and scripts, and compare the emittance obtained using the algorithm with GPT’s estimated emittance. Once concluded, this method will allow for a simple, fast and accurate single shot emittance measurement for the Hybrid accelerator beam.

Original languageEnglish
Article number2092
JournalElectronics (Switzerland)
Volume11
Issue number13
DOIs
StatePublished - 1 Jul 2022

Keywords

  • 3D simulations
  • GPT
  • emittance
  • hybrid RF-Gun
  • multi-slit technique

All Science Journal Classification (ASJC) codes

  • Control and Systems Engineering
  • Signal Processing
  • Hardware and Architecture
  • Computer Networks and Communications
  • Electrical and Electronic Engineering

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