Abstract
For an array of memory cells that are read by threshold measurements, we ask the question of how to choose the measurements in the read sequence to minimize the number of measurements before the array is fully read. We propose and study analytically and experimentally various adaptive read algorithms, and provide corresponding lower bounds on the average number of measurements. We show that new two-dimensional read algorithms improve over the best one-dimensional ones. We further adapt the read algorithms to the case where the cell levels are not uniformly distributed, as motivated by partially-erased memory arrays.
| Original language | English |
|---|---|
| Article number | 6804930 |
| Pages (from-to) | 847-856 |
| Number of pages | 10 |
| Journal | IEEE Journal on Selected Areas in Communications |
| Volume | 32 |
| Issue number | 5 |
| DOIs | |
| State | Published - May 2014 |
Keywords
- Nonvolatile memories (NVM)
- adaptive reading
- binary search
- flash memories
- memory read algorithms
- multi-level memories
- two-dimensional memory arrays
All Science Journal Classification (ASJC) codes
- Computer Networks and Communications
- Electrical and Electronic Engineering
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