Absolute photo-destruction and photo-fragmentation cross section measurements using an electrostatic ion beam trap

Ofer Aviv; Bhim Kafle; Vijayamand Chandrasekaran; Oded Heber; M. L. Rappaport; Hilel Rubinstein; Dirk Schwalm; Daniel Strasser; Y. Toker; Daniel Zajfman

doi:10.1063/1.4804646

Absolute photo-destruction and photo-fragmentation cross section measurements using an electrostatic ion beam trap

Ofer Aviv, Bhim Kafle, Vijayamand Chandrasekaran, Oded Heber, M. L. Rappaport, Hilel Rubinstein, Dirk Schwalm, Daniel Strasser, Y. Toker, Daniel Zajfman

Weizmann Institute of Science, The Hebrew University of Jerusalem

Research output: Contribution to journal › Article › peer-review

Abstract

We describe a technique to measure absolute photo-induced cross sections for cluster anions stored in an electrostatic ion beam trap (EIBT) with a central deflector. The setup allows determination of total photo-destruction cross sections as well as partial cross sections for fragmentation and electron detachment. The unique properties of this special EIBT setup are investigated and illustrated using small Al_n^- clusters.

Original language	English
Article number	053106
Journal	Review of Scientific Instruments
Volume	84
Issue number	5
DOIs	https://doi.org/10.1063/1.4804646
State	Published - May 2013

All Science Journal Classification (ASJC) codes

Instrumentation

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10.1063/1.4804646

Cite this

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title = "Absolute photo-destruction and photo-fragmentation cross section measurements using an electrostatic ion beam trap",

abstract = "We describe a technique to measure absolute photo-induced cross sections for cluster anions stored in an electrostatic ion beam trap (EIBT) with a central deflector. The setup allows determination of total photo-destruction cross sections as well as partial cross sections for fragmentation and electron detachment. The unique properties of this special EIBT setup are investigated and illustrated using small Aln- clusters.",

author = "Ofer Aviv and Bhim Kafle and Vijayamand Chandrasekaran and Oded Heber and Rappaport, \{M. L.\} and Hilel Rubinstein and Dirk Schwalm and Daniel Strasser and Y. Toker and Daniel Zajfman",

note = "Israeli Science Foundation [124/09]; Weizmann Institute of Science through the Joseph Meyerhoff programThis work has been supported by the Israeli Science Foundation (Grant No. 124/09), and by a research grant from the estate of David Turner. D.Sch. acknowledges support by the Weizmann Institute of Science through the Joseph Meyerhoff program.",

year = "2013",

month = may,

doi = "10.1063/1.4804646",

language = "الإنجليزيّة",

volume = "84",

journal = "Review of Scientific Instruments",

issn = "0034-6748",

publisher = "American Institute of Physics",

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TY - JOUR

T1 - Absolute photo-destruction and photo-fragmentation cross section measurements using an electrostatic ion beam trap

AU - Aviv, Ofer

AU - Kafle, Bhim

AU - Chandrasekaran, Vijayamand

AU - Heber, Oded

AU - Rappaport, M. L.

AU - Rubinstein, Hilel

AU - Schwalm, Dirk

AU - Strasser, Daniel

AU - Toker, Y.

AU - Zajfman, Daniel

N1 - Israeli Science Foundation [124/09]; Weizmann Institute of Science through the Joseph Meyerhoff programThis work has been supported by the Israeli Science Foundation (Grant No. 124/09), and by a research grant from the estate of David Turner. D.Sch. acknowledges support by the Weizmann Institute of Science through the Joseph Meyerhoff program.

PY - 2013/5

Y1 - 2013/5

N2 - We describe a technique to measure absolute photo-induced cross sections for cluster anions stored in an electrostatic ion beam trap (EIBT) with a central deflector. The setup allows determination of total photo-destruction cross sections as well as partial cross sections for fragmentation and electron detachment. The unique properties of this special EIBT setup are investigated and illustrated using small Aln- clusters.

AB - We describe a technique to measure absolute photo-induced cross sections for cluster anions stored in an electrostatic ion beam trap (EIBT) with a central deflector. The setup allows determination of total photo-destruction cross sections as well as partial cross sections for fragmentation and electron detachment. The unique properties of this special EIBT setup are investigated and illustrated using small Aln- clusters.

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U2 - 10.1063/1.4804646

DO - 10.1063/1.4804646

M3 - مقالة

SN - 0034-6748

VL - 84

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

IS - 5

M1 - 053106

ER -

Absolute photo-destruction and photo-fragmentation cross section measurements using an electrostatic ion beam trap

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