Absolute photo-destruction and photo-fragmentation cross section measurements using an electrostatic ion beam trap

Ofer Aviv, Bhim Kafle, Vijayamand Chandrasekaran, Oded Heber, M. L. Rappaport, Hilel Rubinstein, Dirk Schwalm, Daniel Strasser, Y. Toker, Daniel Zajfman

Research output: Contribution to journalArticlepeer-review

Abstract

We describe a technique to measure absolute photo-induced cross sections for cluster anions stored in an electrostatic ion beam trap (EIBT) with a central deflector. The setup allows determination of total photo-destruction cross sections as well as partial cross sections for fragmentation and electron detachment. The unique properties of this special EIBT setup are investigated and illustrated using small Aln- clusters.

Original languageEnglish
Article number053106
JournalReview of Scientific Instruments
Volume84
Issue number5
DOIs
StatePublished - May 2013

All Science Journal Classification (ASJC) codes

  • Instrumentation

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