A simple excitation model of parametric resonators: Simulating and explaining the response at cross-over points

Shai Shmulevich, Adne Kassie, David Elata

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We present a new intuitive and rational model of parametric resonance. In parametric resonators one of the system parameters, usually stiffness, is modulated in time. Due to this time modulation the system may develop a periodic response. It is well known that when this modulation is sufficiently strong and at an appropriate frequency, the periodic response may be unbounded - even though the system is not driven directly by an external force. Our model assumes that stiffness is toggled between two distinct values, and that this toggling occurs either when motion is maximal or when velocity is maximal. We show that this model of parametric resonance converges to the classic Meissner parametric resonator, at discrete values of the amplitude and frequency of stiffness modulation. At these critical points the system response is periodic and on the verge of becoming unbounded. The relevance of these critical points is that their discrete nature makes them appealing for sensing and clocking applications in MEMS.

Original languageEnglish
Title of host publication2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2016
ISBN (Electronic)9781509021062
DOIs
StatePublished - 29 Apr 2016
Event17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2016 - Montpellier, France
Duration: 18 Apr 201620 Apr 2016

Publication series

Name2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2016

Conference

Conference17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2016
Country/TerritoryFrance
CityMontpellier
Period18/04/1620/04/16

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering
  • Surfaces, Coatings and Films
  • Modelling and Simulation
  • Safety, Risk, Reliability and Quality
  • Industrial and Manufacturing Engineering

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