A Production Suite for Failure Detectors

Juncheng Dong, Ruhao Xin, Harel Berger, Olivier Marin

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Designing a failure detection algorithm, implementing it, and assessing its performance is extremely complex. The behavior of a failure detector (FD) implementation varies with the evolving conditions of the network, and its initial parameter settings also have a huge impact. In this paper, we introduce a novel production platform as a means of systematizing the design and performance assessment of FDs. It provides a language dedicated to the definition of FDs and uses pre-acquired real-world traces to emulate network conditions. Our platform simplifies and accelerates the design and testing of new FDs, and allows to compare their respective strengths in multiple environments.

Original languageEnglish
Title of host publicationProceedings of 2023 2nd International Conference on Intelligent Computing and Next Generation Networks, ICNGN 2023
EditorsGyu Myoung Lee, Pavel Loskot, Qinmin Yang, Ruidan Su
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798350329070
DOIs
StatePublished - 2023
Externally publishedYes
Event2nd International Conference on Intelligent Computing and Next Generation Networks, ICNGN 2023 - Hangzhou, China
Duration: 17 Nov 202318 Nov 2023

Publication series

NameProceedings of 2023 2nd International Conference on Intelligent Computing and Next Generation Networks, ICNGN 2023

Conference

Conference2nd International Conference on Intelligent Computing and Next Generation Networks, ICNGN 2023
Country/TerritoryChina
CityHangzhou
Period17/11/2318/11/23

Keywords

  • Failure detectors
  • Production suite

All Science Journal Classification (ASJC) codes

  • Artificial Intelligence
  • Computer Networks and Communications
  • Computer Science Applications
  • Computer Vision and Pattern Recognition
  • Safety, Risk, Reliability and Quality
  • Modelling and Simulation
  • Instrumentation

Cite this