A Dual Negative Word-Line Technique for Improving Read Access in GC-eDRAM Arrays

A. Teman, Roman Golman, R. Giterman

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Original language	American English
Title of host publication	IEEE Int. Conf. on the Science of Electrical Engineering (ICSEE)
State	Published - 2018

Cite this

@inproceedings{4c35486eef184db2bd3f38b2c09fc470,

title = "A Dual Negative Word-Line Technique for Improving Read Access in GC-eDRAM Arrays",

author = "A. Teman and Roman Golman and R. Giterman",

note = "Place of conference:Eilat, Israel",

year = "2018",

language = "American English",

booktitle = "IEEE Int. Conf. on the Science of Electrical Engineering (ICSEE)",

}