A degenerately doped In0.53Ga0.47As bipolar junction transistor

E. Yalon, D. Cohen Elias, A. Gavrilov, S. Cohen, R. Halevy, D. Ritter

Research output: Contribution to journalArticlepeer-review

Abstract

An InGaAs bipolar junction transistor having degenerately doped base and emitter layers is reported. The high emitter efficiency is attributed to the asymmetry between the density of states of the conduction and valence bands. A high-frequency transistor having base and emitter metals simultaneously deposited on the emitter layer is demonstrated. The base contact backward diode resistance was 125 Ωċμm2.

Original languageEnglish
Article number5629435
Pages (from-to)21-23
Number of pages3
JournalIEEE Electron Device Letters
Volume32
Issue number1
DOIs
StatePublished - Jan 2011

Keywords

  • Bipolar junction transistor (BJT)
  • heterojunction bipolar transistor (HBT)

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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