Abstract
An InGaAs bipolar junction transistor having degenerately doped base and emitter layers is reported. The high emitter efficiency is attributed to the asymmetry between the density of states of the conduction and valence bands. A high-frequency transistor having base and emitter metals simultaneously deposited on the emitter layer is demonstrated. The base contact backward diode resistance was 125 Ωċμm2.
Original language | English |
---|---|
Article number | 5629435 |
Pages (from-to) | 21-23 |
Number of pages | 3 |
Journal | IEEE Electron Device Letters |
Volume | 32 |
Issue number | 1 |
DOIs | |
State | Published - Jan 2011 |
Keywords
- Bipolar junction transistor (BJT)
- heterojunction bipolar transistor (HBT)
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering