Shor Joseph

Research output

Research output per year 2011 2018 2020 2024

• 27 Article
• 16 Conference contribution
• 14 Patent
• 1 Editorial
• 1 More
  • 1 Review article

Research output per year

Research output per year

Search results

• 2024

  A Fully Integrated, Switched-Capacitor DC-DC Buck Converter Featuring an Inverter-Based Comparator

  Emanovic, E., Jurisic, D. & Shor, J., 2024, In: IEEE Access. 12, p. 86425-86433 9 p.

  Bar-Ilan University

  Research output: Contribution to journal › Article › peer-review

  Open Access

  • DC-DC converters 100%
  • Capacitors 80%
  • Voltage 73%
  • Electric potential 52%
  • Analog circuits 28%

• An 11uW, 0.08 mm², 125dB-Dynamic-Range Current-Sensing Dynamic CT Zoom ADC

  Shifman, Y. & Shor, J., 2024, In: IEEE Transactions on Circuits and Systems I: Regular Papers. 71, 8, p. 3489-3501 13 p.

  Bar-Ilan University

  Research output: Contribution to journal › Article › peer-review

  • Electric potential 100%
  • Resistors 62%
  • Capacitance 55%
  • Transistors 55%
  • Detectors 50%

• A Photovoltaic Energy Harvester/Image Sensor Platform with Event Detection Capability in 180 nm

  Zagouri, D., Rimer, A., Emanovic, E., Ninio, Y., Slezak, Y., Jurisic, D., Fish, A. & Shor, J., 1 Jan 2024, In: IEEE Solid-State Circuits Letters. 7, p. 62-65 4 p.

  Bar-Ilan University

  Research output: Contribution to journal › Article › peer-review

• Voltage Level Detection for Near-V_THComputing

  Feldman, A., Nechushtan, O. & Shor, J., 1 Jun 2024, In: IEEE Journal of Solid-State Circuits. 59, 6, p. 1847-1857 11 p.

  Bar-Ilan University

  Research output: Contribution to journal › Article › peer-review

  • Electric potential 100%
  • Detectors 75%
  • Networks (circuits) 26%
  • Integrated circuits 22%
  • Temperature 9%
• 2022

  A 700-µm², Ring-Oscillator-Based Thermal Sensor in 16-nm FinFET

  Lempel, Y., Breuer, R. & Shor, J., 1 Feb 2022, In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 30, 2, p. 248-252 5 p.

  Bar-Ilan University

  Research output: Contribution to journal › Article › peer-review

  • FinFET 100%
  • Sensors 40%
  • Hot Temperature 37%
  • Microprocessor chips 35%
  • Energy utilization 27%

• A Method for Mitigation of Droop Timing Errors Including a 500 MHz Droop Detector and Dual Mode Logic

  Shifman, Y., Stanger, I., Shavit, N., Taco, R., Fish, A. & Shor, J., 1 Feb 2022, In: IEEE Journal of Solid-State Circuits. 57, 2, p. 596-608 13 p.

  Bar-Ilan University

  Research output: Contribution to journal › Article › peer-review

  Open Access

  • Detectors 100%
  • Adders 70%
  • Logic circuits 24%
  • Digital circuits 23%
  • Electric potential 22%

• A Resistor-Less nW-Level Bandgap Reference With Fine-Grained Voltage and Temperature Coefficient Trims

  Bass, O., Feldman, A. & Shor, J., 1 Jan 2022, In: IEEE Open Journal of Circuits and Systems. 3, p. 192-198 7 p., 9888150.

  Bar-Ilan University

  Research output: Contribution to journal › Article › peer-review

  • resistors 100%
  • capacitors 56%
  • coefficients 53%
  • electric potential 52%
  • configurations 35%

• Preselection Methods to Achieve Very Low BER in SRAM-Based PUFs - A Tutorial

  Shifman, Y. & Shor, J., 1 Jun 2022, In: IEEE Transactions on Circuits and Systems II: Express Briefs. 69, 6, p. 2551-2556 6 p.

  Bar-Ilan University

  Research output: Contribution to journal › Article › peer-review

  • Hardware security 100%
  • Static random access storage 87%
  • Error correction 11%
  • Silicon 8%
  • Networks (circuits) 6%
• 2021

  A 5800 μm² Process Monitor Circuit for Measurement of in-Die Variation of V_thin 65nm

  Lisha, L., Bass, O. & Shor, J., Mar 2021, In: IEEE Transactions on Circuits and Systems II: Express Briefs. 68, 3, p. 863-867 5 p., 9184121.

  Bar-Ilan University

  Research output: Contribution to journal › Article › peer-review

  • Networks (circuits) 100%
  • Threshold voltage 66%
  • Electric potential 62%
  • Modulators 61%
  • Integrated circuits 55%

• A 8800 μm2 CCO-Based Voltage-Droop and Temperature Detector in 65nm

  Mizrahi, A., Shifman, Y. & Shor, J., 2021, In: IEEE Access.

  Bar-Ilan University

  Research output: Contribution to journal › Article › peer-review

  Open Access

  • Detectors 100%
  • Voltage 92%
  • Electric potential 66%
  • Temperature 51%
  • Resonance 33%
• 2020

  A 2 Bit/Cell Tilting SRAM-Based PUF With a BER of 3.1E-10 and an Energy of 21 FJ/Bit in 65nm

  Shifman, Y., Miller, A., Weizmann, Y. & Shor, J., 1 Jan 2020, In: IEEE Open Journal of Circuits and Systems. 1, p. 205-217 13 p., 9246212.

  Bar-Ilan University

  Research output: Contribution to journal › Article › peer-review

  Open Access

  • energy 100%
  • transistors 79%
  • cells 53%
  • decision support systems 33%
  • electric potential difference 25%

• A Charge Balancing 1450 um²PNP-Based Thermal Sensor for Dense Thermal Monitoring

  Bass, O. & Shor, J., Dec 2020, In: IEEE Transactions on Circuits and Systems II: Express Briefs. 67, 12, p. 2963-2967 5 p., 9106352.

  Bar-Ilan University

  Research output: Contribution to journal › Article › peer-review

  • Monitoring 100%
  • Sensors 91%
  • Hot Temperature 85%
  • Program processors 43%
  • Energy gap 28%

• A Method to Utilize Mismatch Size to Produce an Additional Stable Bit in a Tilting SRAM-Based PUF

  Shifman, Y., Miller, A., Keren, O., Weizman, Y. & Shor, J., 2020, In: IEEE Access. 8, p. 219137-219150 14 p., 9277526.

  Bar-Ilan University

  Research output: Contribution to journal › Article › peer-review

  Open Access

  • Response Function 100%
  • Hardware security 91%
  • Static random access storage 79%
  • Entropy 58%
  • Mirrors 33%

• A Miniaturized 0.003 mm²PNP-Based Thermal Sensor for Dense CPU Thermal Monitoring

  Bass, O. & Shor, J., Sep 2020, In: IEEE Transactions on Circuits and Systems I: Regular Papers. 67, 9, p. 2984-2992 9 p., 9082088.

  Bar-Ilan University

  Research output: Contribution to journal › Article › peer-review

  • Program processors 100%
  • Bipolar transistors 72%
  • Energy gap 66%
  • Monitoring 66%
  • Sensors 60%

• An Accurate 0.55-V 2.6-μW Voltage-Level Detector

  Feldman, A. & Shor, J., 2020, In: IEEE Solid-State Circuits Letters. 3, p. 166-169 4 p., 9129800.

  Bar-Ilan University

  Research output: Contribution to journal › Article › peer-review

  • Detectors 100%
  • Electric potential 66%
  • Detector circuits 40%
  • Energy gap 29%
  • Networks (circuits) 28%

• An SRAM-Based PUF with a Capacitive Digital Preselection for a 1E-9 Key Error Probability

  Shifman, Y., Miller, A., Keren, O., Weizman, Y. & Shor, J., Dec 2020, In: IEEE Transactions on Circuits and Systems I: Regular Papers. 67, 12, p. 4855-4868 14 p., 9104879.

  Bar-Ilan University

  Research output: Contribution to journal › Article › peer-review

  • Hardware security 100%
  • Static random access storage 87%
  • Error correction 20%
  • Capacitance 8%
  • Stabilization 8%

• Ultra Miniature 1850 μm² Ring Oscillator Based Temperature Sensor

  Vinshtok-Melnik, N. & Shor, J., 2020, In: IEEE Access. 8, p. 91415-91423 9 p., 9093007.

  Bar-Ilan University

  Research output: Contribution to journal › Article › peer-review

  Open Access

  • Thermal Runaway 100%
  • Temperature sensors 71%
  • Semiconductor 50%
  • Band Gap 49%
  • Sensors 33%
• 2018

  0.45 v and 18 μa/MHZ MCU SOC with advanced adaptive dynamic voltage control (ADVC)

  Zangi, U., Feldman, N., Hadas, T., Dayag, N., Shor, J. & Fish, A., 1 Jun 2018, In: Journal of Low Power Electronics and Applications. 8, 2, 14.

  Bar-Ilan University

  Research output: Contribution to journal › Article › peer-review

  Open Access

  • System-on-chip 100%
  • Microcontrollers 95%
  • Voltage control 91%
  • Electric potential 50%
  • Silicon sensors 29%

• A Low Noise Low Offset Readout Circuit for Magnetic-Random-Access-Memory

  Mordakhay, A., Telepinsky, Y., Klein, L., Shor, J. & Fish, A., 1 Apr 2018, In: IEEE Transactions on Circuits and Systems I: Regular Papers. 65, 4, p. 1224-1233 10 p.

  Bar-Ilan University

  Research output: Contribution to journal › Article › peer-review

  • Data storage equipment 100%
  • Networks (circuits) 90%
  • Topology 74%
  • Electric network topology 67%
  • Transfer functions 49%

• A method to improve reliability in a 65-nm SRAM PUF array

  Shifman, Y., Miller, A., Keren, O., Weizmann, Y. & Shor, J., 2018, In: IEEE Solid-State Circuits Letters. 1, 6, p. 138-141 4 p., 8519616.

  Bar-Ilan University

  Research output: Contribution to journal › Article › peer-review

  • Hardware security 100%
  • Static random access storage 87%
  • Error correction 20%
  • Testing 10%
  • Temperature 7%

• Miniaturized, 0.01 mm², Resistor-Based Thermal Sensor with an Energy Consumption of 0.9 nJ and a Conversion Time of 80 μs for Processor Applications

  Mordakhay, A. & Shor, J., Oct 2018, In: IEEE Journal of Solid-State Circuits. 53, 10, p. 2958-2969 12 p., 8445659.

  Bar-Ilan University

  Research output: Contribution to journal › Article › peer-review

  • Resistors 100%
  • Energy utilization 72%
  • Sensors 52%
  • Hot Temperature 49%
  • Comparator circuits 25%
• 2016

  A Compact First-Order ΣΔ Modulator for Analog High-Volume Testing of Complex System-on-Chips in a 14 nm Tri-Gate Digital CMOS Process

  Oshita, T., Shor, J., Duarte, D. E., Kornfeld, A., Geannopoulos, G. L., Douglas, J. & Kurd, N., 1 Feb 2016, In: IEEE Journal of Solid-State Circuits. 51, 2, p. 378-390 13 p., 7370772.

  Research output: Contribution to journal › Article › peer-review

  • Modulators 100%
  • System-on-chip 99%
  • Large scale systems 83%
  • Intellectual property 59%
  • Testing 50%

• An Accurate Bandgap-Based Power-on-Detector in 14-nm CMOS Technology

  Shor, J. & Zilberman, D., May 2016, In: IEEE Transactions on Circuits and Systems II: Express Briefs. 63, 5, p. 428-432 5 p., 7347377.

  Bar-Ilan University

  Research output: Contribution to journal › Article › peer-review

  • Energy gap 100%
  • Detectors 68%
  • Detector circuits 45%
  • Electric potential 45%
  • Diodes 27%

• Dual-Mode Low-Drop-Out Regulator/Power Gate With Linear and On-Off Conduction for Microprocessor Core On-Die Supply Voltages in 14 nm

  Luria, K., Shor, J., Zelikson, M. & Lyakhov, A., Mar 2016, In: IEEE Journal of Solid-State Circuits. 51, 3, p. 752-762 11 p., 7383230.

  Bar-Ilan University

  Research output: Contribution to journal › Article › peer-review

  • Microprocessor chips 100%
  • Compensation and Redress 84%
  • Electric potential 57%
  • Capacitance 47%
  • Networks (circuits) 30%
• 2015

  Compact BJT-based thermal sensor for processor applications in a 14 nm tri-gate CMOS process

  Oshita, T., Shor, J., Duarte, D. E., Kornfeld, A. & Zilberman, D., 1 Mar 2015, In: IEEE Journal of Solid-State Circuits. 50, 3, p. 799-807 9 p.

  Research output: Contribution to journal › Article › peer-review

  • Sensors 100%
  • Hot Temperature 93%
• 2013

  Miniaturized BJT-based thermal sensor for microprocessors in 32-and 22-nm technologies

  Shor, J. S. & Luria, K., 2013, In: IEEE Journal of Solid-State Circuits. 48, 11, p. 2860-2867 8 p., 6605620.

  Research output: Contribution to journal › Article › peer-review

  • Microprocessor chips 100%
  • Sensors 57%
  • Hot Temperature 53%
  • Electric potential 38%
  • Digital signal processing 37%
• 2012

  A fully integrated multi-CPU, processor graphics, and memory controller 32-nm processor

  Yuffe, M., Mehalel, M., Knoll, E., Shor, J., Kurts, T., Altshuler, E., Fayneh, E., Luria, K. & Zelikson, M., Jan 2012, In: IEEE Journal of Solid-State Circuits. 47, 1, p. 194-205 12 p., 6044730.

  Research output: Contribution to journal › Article › peer-review

  • Program processors 100%
  • Data storage equipment 71%
  • Controllers 63%
  • Clocks 50%
  • Energy conservation 46%