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Dive into the research topics where Joseph Bernstein is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Gate Driver for High-Frequency Power Converter
Cohen, L., Bernstein, J. B. & Aharon, I., Jan 2025, In: Electronics (Switzerland). 14, 2, 224.Research output: Contribution to journal › Article › peer-review
Open Access -
Reliability Challenges, Models, and Physics of Silicon Carbide and Gallium Nitride Power Devices
Avraham, T., Dhyani, M. & Bernstein, J. B., Mar 2025, In: Energies. 18, 5, 1046.Research output: Contribution to journal › Review article › peer-review
Open Access -
Modern Trends in Microelectronics Packaging Reliability Testing
Bender, E., Bernstein, J. B. & Boning, D. S., Mar 2024, In: Micromachines. 15, 3, 398.Research output: Contribution to journal › Review article › peer-review
Open Access -
Reliability Prediction for Microelectronics
Bernstein, J. B., Bender, E. & Bensoussan, A., 1 Jan 2024, Hoboken, NJ. 374 p. (Quality and reliability engineering series)Research output: Book/Report › Book › peer-review
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Statistical degradation in BGAs for early fault detection
Bender, E., Avraham, T., Bernstein, J. B. & Boning, D. S., 2024, ISTFA 2024: Proceedings from the 50th International Symposium for Testing and Failure Analysis Conference. ASM International, p. 440-446 7 p. (Conference Proceedings from the International Symposium for Testing and Failure Analysis; vol. 2024-October).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review